Aarhus Universitets segl


Transmission and scanning electron microscopy uses an electron beam accelerated to high voltage to investigate samples on the micrometer and nanoscale. Transmission electron microscopy detects the electrons after passing through the sample and allows imaging the sample down to the atomic level. The technique allows imaging of the size and shape of small objects down to the atom. In scanning electron microscopy are the images generated by scanning a highly focused beam across the sample. The imaging can be combined with chemical analysis through energy dispersive X-ray spectroscopy (EDX), which allows chemical mapping, this is especial valuable for investigating hybrid materials.